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Study of xenon ion-induced silicon amorphization using transmission electron microscopy and Monte Carlo simulation
Podorozhniy O.V., Rumyantsev A.V., Borgardt N.I., Minnebaev D.K., Ieshkin A.E.
Diversity of different atomic groups in the Cu-NbTi composite under the influence of batch hydroextrusio
Samoylenko Z.A., Ivakhnenko N.N., Pushenko E.I., Badekin M.Y., Chernyavskaya N.V.
Complex Diagnostics of Silicon-on-Insulator Layers after Ion Implantation and Annealing
Yunin P.A., Drozdov M.N., Novikov A.V., Shmagin V.B., Demidov E.V., Mikhailov A.N., Tetelbaum D.I., Belov A.I.
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